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. 2016 Sep 14;9(9):775. doi: 10.3390/ma9090775
NPs nanoparticles
SERS surface-enhanced Raman scattering
LA laser ablation
DLS dynamic light scattering
UV-Vis ultraviolet-visible
XPS X-ray photoelectron spectroscopy
AFM atomic force microscopy
SKPM scanning Kelvin probe microscopy