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. 2013 Jun 20;6(6):2543–2577. doi: 10.3390/ma6062543

Figure 10.

Figure 10

(a) Scanning electron micrograph (SEM) of PAN tubular coating on SWNT. High-resolution transmission electron micrograph (HR-TEM) of tubular coated PAN/SWNT samples; (b) at the onset of electron beam exposure; (c and d1) show an area of the PAN/SWNT sample where the PAN lattice of ~0.52 nm is observed; and (d2) a schematic highlighting the PAN lattice observations in (d1) [187].