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. 2017 Jun 5;7:2765. doi: 10.1038/s41598-017-02944-1

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© The Author(s) 2017

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Nanocrystal structural characterization. (a) XRD spectra for drop-cast and annealed films of Cu₂Se. In this plot, q is in units of 2π/d. The reference peaks are calculated from the room temperature structure determined by Gulay et al.³⁷. (b–h) Top-view SEM images of thin films that were annealed at the same temperature as the drop-cast samples used for XRD spectra in (a). In panel (h), “NA” stands for “not annealed”. Each image is 170 nm across. (i) Low resolution TEM image of Cu₂Se nanocrystals. (j) High resolution TEM image of a Cu₂Se nanocrystal.