Figure 3.

Thermoelectric Performance as a Function of Annealing Temperature. (a–d) Room temperature values for Seebeck coefficient, in-plane electrical conductivity, cross-plane thermal conductivity, and ZT, respectively, plotted as functions of annealing temperature (“NA” stands for “not annealed”). The gray symbols in panel (c) are estimates of the lattice thermal conductivity, which are computed using the Wiedemann-Franz Law, κ _lattice = κ _total − σ _e LT, where κ _total = κ _electronic + κ _lattice is the total thermal conductivity measured by TDTR, σ _e is the electrical conductivity of the film, L = 2.44 × 10⁻⁸  W Ω K ⁻² is the Lorenz number in the degenerate limit, and T is room temperature in Kelvins. The data in this figure are from samples derived from the same synthetic batch. We report the results, except for thermal conductivity, for a second batch of nanocrystals in Supplementary Figure 12.