Table 1. Electroluminescent and lifetime characteristics for CONV, GRAD and managed PHOLEDs (M0–M5) at L 0=1,000 cd m−2.
Device | J0 (mA cm−2) | EQE (%) | V0 (V) | CIE* | T90 (h) | T80 (h) | ΔV(T90) (V) | ΔV(T80) (V) |
---|---|---|---|---|---|---|---|---|
CONV | 6.7±0.1 | 8.0±0.1 | 6.6±0.0 | [0.15, 0.28] | 27±4 | 93±9 | 0.3±0.1 | 0.4±0.1 |
GRAD | 5.7±0.1 | 8.9±0.1 | 8.0±0.0 | [0.16, 0.30] | 47±1 | 173±3 | 0.6±0.1 | 0.9±0.1 |
M0 | 5.5±0.1 | 9.4±0.1 | 9.2±0.0 | [0.16, 0.30] | 71±1 | 226±9 | 0.9±0.1 | 1.2±0.1 |
M1 | 5.4±0.1 | 9.5±0.1 | 8.8±0.1 | [0.16, 0.29] | 99±3 | 260±15 | 1.2±0.1 | 1.6±0.1 |
M2 | 5.4±0.1 | 9.3±0.0 | 8.9±0.1 | [0.16, 0.31] | 103±0 | 285±8 | 0.7±0.1 | 1.0±0.1 |
M3 | 5.3±0.1 | 9.6±0.0 | 9.0±0.1 | [0.16, 0.30] | 141±11 | 334±5 | 1.1±0.1 | 1.5±0.2 |
M4 | 5.2±0.1 | 9.6±0.2 | 8.6±0.0 | [0.16, 0.31] | 126±7 | 294±16 | 1.0±0.1 | 1.3±0.1 |
M5 | 5.1±0.1 | 9.9±0.1 | 8.6±0.0 | [0.16, 0.31] | 119±6 | 306±3 | 0.9±0.1 | 1.2±0.1 |
EQE, external quantum efficiency.
*Measured at current density of J=5 mA cm−2.
Errors for the measured values are s.d. from at least three devices.