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. 2017 Jun 7;3(6):e00312. doi: 10.1016/j.heliyon.2017.e00312

Table 5.

Summary of algorithm reporting for the negative control containing arrays at 300 ms and 400 ms integration durations. This data include 145 h run time for each device. Table 6 provides detailed information on WypAll control swatch responses.

Integration Duration True Positives False Positives False Negatives True Negatives Specificity Sensitivity
WypAll, 300 ms integration
s1 7 14 0 99 0.88 1.00
s2 7 13 0 95 0.88 1.00
s3 7 9 0 101 0.92 1.00
s3th1 7 10 0 125 0.93 1.00
s3th2 3 2 4 134 0.99 0.43
s3th1b 3 2 4 134 0.99 0.43
s3th2b 2 2 5 133 0.99 0.29
WypAll, 400 ms integration
s1 7 12 0 85 0.88 1.00
s2 7 15 0 97 0.87 1.00
s3 7 14 0 107 0.88 1.00
s3th1 7 4 0 130 0.97 1.00
s3th2 4 2 3 135 0.99 0.57
s3th1b 4 2 3 135 0.99 0.57
s3th2b 1 2 6 133 0.99 0.14
Printer Paper Negative Control, 400 ms integration
S1 7 16 0 83 0.84 1.00
S2 7 10 0 79 0.89 1.00
S3 7 9 0 86 0.91 1.00
S3th1 5 7 2 108 0.94 0.71
S3th2 5 2 2 122 0.98 0.71
S3th1b 5 2 2 122 0.98 0.71
S3th2b 5 2 2 123 0.98 0.71
Waxed Weigh Paper Negative Control, 400 ms integration
S1 7 10 0 96 0.91 1.00
S2 7 12 0 100 0.89 1.00
S3 7 9 0 108 0.92 1.00
S3th1 7 4 0 122 0.97 1.00
S3th2 2 1 5 127 0.99 0.29
S3th1b 2 1 5 127 0.99 0.29
S3th2b 2 1 5 129 0.99 0.29