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. 2017 Jun 9;7:3195. doi: 10.1038/s41598-017-03329-0

Figure 4.

Figure 4

(a) 2D plot of the fraction of poses that can be measured with different grating arrangements and different ψ angle limitation. (b) Fraction of poses that can be measured with maximum reachable ψ = 40° for acquisition schemes Z(S, N). Red curve corresponds to the black line marked in (a). We study three points on these curves corresponding to vertical, diagonal and horizontal grating alignment denoted by Z V(N), Z D(N) and Z H(N) respectively.