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. 2017 Jun 20;17:108. doi: 10.1186/s12870-017-1056-9

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© The Author(s). 2017

Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The Creative Commons Public Domain Dedication waiver (http://creativecommons.org/publicdomain/zero/1.0/) applies to the data made available in this article, unless otherwise stated.

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Fig. 4 — RNA-seq expression profiles of ABC, NLR and START genes in resistant (R) wheat line (Avocet-Yr5) and susceptible (S) wheat cultivar (Vuka) inoculated with yellow rust pathogen Puccinia striiformis f. sp. tritici (Pst) during 5 and 11 days post inoculation, respectively. Abbreviations: DPI, days post inoculation; TPM, number of transcripts per million reads; R_ABC, ABC gene expression in resistant wheat; R_NLR, NLR gene expression in resistant wheat; R_START, START gene expression in resistant wheat; S_ABC, ABC gene expression in susceptible wheat; S_NLR, NLR gene expression in susceptible wheat; S_START, START gene expression in susceptible wheat