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. 2017 May 17;8(6):2976–2989. doi: 10.1364/BOE.8.002976

Fig. 2.

Fig. 2

(a) The SP-IRIS substrate consists of a thin film of thermally grown oxide on polished silicon. Incident light (Einc) is both reflected by the substrate (Eref) and scattered by the immobilized nanoparticle (Escat). (b) Schematic of the reflection microscope. The LED source is imaged to the objective back pupil, providing Köhler illumination (dashed lines). Collected scattered light from a particular particle is indicated by red shadow.