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. 2017 Jun 15;8:15763. doi: 10.1038/ncomms15763

Figure 4. Raman spectroscopy.

Figure 4

Raman spectra acquired at 514.5 nm of (a) GW flakes (black) and a GW film deposited on SiO2/Si (red) and of (b) GEth flakes (black) and a GEth film (red). Statistics of (c) Pos(G), (d) FWHM(G), (e) Disp(G) and (f) FWHM(2D) for GEth (grey) and GW (red) films.