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. 2017 Jun 19;9(3):200–207. doi: 10.4047/jap.2017.9.3.200

Fig. 6. SEM-SE micrographs of (A) IPS empress CAD-Listerine, (C) Lava Ultimate CAD-Klorhex, (E) IPS e.max CAD-Tantum Verde; linear histograms (B), (D), (F) by post processing of SEM images showing hills and valleys for corresponding lines in images.

Fig. 6