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. Author manuscript; available in PMC: 2018 May 1.
Published in final edited form as: Carbon N Y. 2017 Jan 11;115:441–448. doi: 10.1016/j.carbon.2017.01.023

Table 1. Average global surface roughness of Cu film across 120×160 μm2 surfaces, coverage of transferred graphene measured by SEM image and image processing software, and monolayer-bilayer coverage processed by analyzing three sets of Raman map data from each Cu-Ni thicknesses.

Cu thickness in Cu-Ni (nm) Global1 roughness (nm) Coverage2 (transferred, %) Monolayer3 coverage (% of Coverage) >Bilayer3 coverage (% of Coverage)
100 96 46 95 5
150 50 78 99 1
200 55 88 96 4
250 53 97 97 3
500 69 94 80 20
750 54 98 74 26
1000 58 97 56 44
1

Optical profilometer

2

Measurement by SEM

3

Measurement by Raman