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. 2017 Jun 28;3(6):e1700685. doi: 10.1126/sciadv.1700685

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Copyright © 2017 The Authors, some rights reserved; exclusive licensee American Association for the Advancement of Science. No claim to original U.S. Government Works. Distributed under a Creative Commons Attribution NonCommercial License 4.0 (CC BY-NC).

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Fig. 4 — (A) Cumulative area fraction of the in-plane grain size of the Ni_83.6Mo₁₄W_2.4 films annealed at various temperatures. (B) Cross-sectional TEM image of the film annealed for 1 hour at 600°C. FIB channeling contrast (C) and cross-sectional TEM image of a film that was loaded up to 3.1 GPa (D). No obvious changes in the columnar microstructure or twin size/spacing were observed.