Skip to main content
. Author manuscript; available in PMC: 2018 Apr 1.
Published in final edited form as: IEEE Trans Med Imaging. 2016 Dec 22;36(4):917–929. doi: 10.1109/TMI.2016.2643684

Fig. 8.

Fig. 8

Sixty-four bin histograms of LD test statistics for different defect types for Tc at iteration number 1 (4 subsets/iteration) and cutoff frequency 0.1 pixel−1. The graphs, from top to bottom, are for defect types 1–6, respectively