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. 2017 Jul 4;7:4595. doi: 10.1038/s41598-017-04079-9

Figure 2.

Figure 2

(a) Corrosion of FTO and ITO films during a slow scan (5 mV s−1) to 3.2 VRHE in 0.1 M H2SO4 purged with argon. (b) Comparison of the integrated dissolution during OER normalized by the portion of the respective element in the material (bars) and onset potential of dissolution, OPD (bullets).