Fig. 7. (a) Photocurrent of α-Fe₂O_3–x before (black) and after deposition of an ALD Al₂O₃ layer (1 nm, red trace) recorded using a low power 75 W Xe lamp, dark traces are shown as dashed lines. (b) Overlay of the TA trace recorded at 580 nm, assigned to an interband trap state, and the normalized charge extracted for (b) α-Fe₂O_3–x and (c) α-Fe₂O_3–x/Al₂O₃ following UV excitation (355 nm) at 1.4 V_RHE. All traces are recorded in 1 M NaOH.51.