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. 2017 Jul 6;7:4812. doi: 10.1038/s41598-017-05142-1

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© The Author(s) 2017

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Measurement of the single-photon detector (SNSPD) performance. (а) Count rate of the W-shaped nanowire vs bias current, at different levels of optical power at 1550 nm wavelength. The photon flux is shown above each curve and marked by individual colors. The count rate when the laser is turned off but connected to an optical fiber at a room temperature is marked by SDC. The count rate with a closed metal cup is marked as BIP. The intrinsic dark counts marked as IDC (b) Dependence of the normalized on-chip detection efficiency (η _oc) on count rate. The black squares correspond to the measured data for U-shaped nanowire, while the blue dots for W-shaped nanowire. The fitted values are represented with solid lines and the arrows indicate the count rate $N_{C R}^{3 d B}$ at which $η_{o c} (N_{C R}^{3 d B}) = η_{o c}^{\max} / 2.$ (с) Normalized maximum current vs count rate. The black squares represent the measured dependence for U-shaped detector, while the blue dots for the W-shaped detector. The fitted values are represented with solid lines.