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. 2015 May 26;6(8):4665–4673. doi: 10.1039/c5sc00957j

Fig. 8. AFM image and height profile of a flake of 4 obtained by mechanical exfoliation on a 285 nm SiO2/Si substrate. Three nanosheets of about 2, 4 and 12 nm are discernible.

Fig. 8