Figure 4. Comparison of single hit selections by principal component analysis (PCA), Chi-sqaured metric and manifold embedding.

Summed diffraction patterns of (a) PCA, (b) Chi-squared metric and (c) manifold embedding. (d) Averaged signal over angle (power spectral density, PSD) as a function of spatial frequency and resolution. Five diffraction maxima are fully captured within the detector edges. The sixth maximum is captured within the detector corners.