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. 2017 Mar 7;10(3):268. doi: 10.3390/ma10030268

Figure 1.

Figure 1

Light optical microscopy (LOM) of (a) the upper region and of (b) the entire central cross section of a Ti-64 sample along the SLM building direction. Backscattered electron mode-scanning electron microscopy (BSE-SEM) images are shown, corresponding to selected regions of the microstructure for (c) z ~ 10 mm (top); (d) z ~ 5 mm (center) and (e) z ~ 0 mm (bottom).