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. 2017 Jul 18;12(7):e0181369. doi: 10.1371/journal.pone.0181369

Fig 8. Patterned particle monolayer prepared from soft and stiff microgel particles.

Fig 8

AFM height retrace of a patterned microgel monolayer formed upon sequential deposition of stiff microgels pOEGMA80/10 and soft microgels pOEGMA75/0 on an APTMS-functionalized glass substrate. Scan size: 50 μm x 50 μm (a). AFM phase retrace of the patterned microgel monolayer recorded at a scan size of 10 μm x 10 μm (b).