Table 1.

Operation fidelities

Gate	1−${\mathcal{F}}_{\mathbf{RB}}$ (%)	$\Delta {\mathcal{F}}_{\mathbf{PT}}$ (%)	1−${\mathcal{F}}_{\mathbf{sim}}$ (%)
I	0.78 ± 0.06	0.51	0.44
X90	1.34 ± 0.09	0.57	1.20
-X90	1.54 ± 0.10	0.71	1.31
X180	1.89 ± 0.12	0.88	1.57
Y90	1.63 ± 0.11	0.98	1.23
-Y90	1.38 ± 0.09	0.52	1.23
Y180	2.18 ± 0.14	0.99	2.18
H	1.58 ± 0.11	0.86	1.52
Average	1.54 ± 0.10	0.75	1.34
UencUdec	2.89 ± 0.18	1.39	2.71
T	–	0.71	0.66

Measured and simulated gate infidelities. ${\mathcal{F}}_{\mathrm{RB}}$, $\Delta {\mathcal{F}}_{\mathrm{PT}}$ and ${\mathcal{F}}_{\mathrm{sim}}$ are the values extracted from interleaved randomized benchmarking, process tomography (see Fig. 3) and simulations using the Lindblad master equation, respectively. The row labeled “average” gives the fidelities averaged over the first eight gates, which is the set used in the standard randomized benchmarking experiment