Figure 2.

Example of combined photoluminescence and atomic force microscopy to correlate quantum dot location and surface morphological features (a) EMCCD image of the photoluminescence from a single QD and reflected light by the alignment marks (metallic crosses), acquired by illuminating the sample simultaneously with both the red and near-infrared LEDs, at a temperature of 4 K. (b) Atomic force microscope image of the area between two alignment marks (top right corner of panel (a)). (c,d) Atomic force microscope images of a 10 nm-high surface oval defect (found in correspondence to the dashed red circle in panel (b)) on which the position of the QD, measured from the photoluminescence image (red symbol in panel (c) and arrow in panel (d)), is shown. The one standard deviation uncertainty in the position of the QD is estimated to be 17 nm (see main text). [Sample I].