Table 1.

Summary table of the photoluminescence/atomic force microscopy results obtained from the measurements carried out on the different samples under study.

Sample	No. of QDs analyzed	AFM feature type	No. of matching AFM/QD positions
I	25	oval	7
II	21	dip	5
III	33	crater	19
IV	10	oval	6

The number of QDs that have been analyzed (photoluminescence positioning, spectral characterisation, and atomic force microscopy), the type of surface features observed with the atomic force microscope (examples of “oval, “dip” and “crater” features are shown in Figs 2d, 3c (first column), 3c (second column) respectively), and the number of instances in which the stated AFM surface feature type was observed in proximity to the QD’s emitting dipole are shown.