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. 2017 Jul 25;12:465. doi: 10.1186/s11671-017-2232-4

Fig. 7.

Fig. 7

The electric field distribution in the xy plane for resonant wavelength of 668 nm on a interface 1: the top TiN disk surface, b interface 2: the interface between the TiN disk and SiO2 layer, and c interface 3: the interface between SiO2 layer and bottom TiN layer