Stochastic Modeling Yields a Mechanistic Framework for Spindle Attachment Error Correction in Budding Yeast Mitosis

. Author manuscript; available in PMC: 2018 Jun 28.

Published in final edited form as: Cell Syst. 2017 Jun 7;4(6):645–650.e5. doi: 10.1016/j.cels.2017.05.003


Parameter Values
Parameter Description	Symbol	Value
Growth and shortening velocity	V	20 nm/s^a
Chromatin spring constant	k_chrom	14 pN/μm^b
Chromatin rest length	x_eq	200 nm^c
Maximum tension for Ipl1 activity	T	0.5 pN^d
Maximum distance of MT plus ends for KT capture	d	17 nm^e
Number of Ip1 substrates, single state phosphorylation model	N	1
Critical phosphorylation for detachment, single state phosphorylation model	N_cr	1
Number of Ip1 substrates, multistate phosphorylation model	N	10^f
Critical phosphorylation for detachment, multistate phosphorylation model	N_cr	8–10

^a(Gardner, et al., 2005, 2008)
^b(Chacon, et al., 2014)
^c(Gardner, et al., 2005)
^destimated value (Dewar, et al., 2004; Tanaka, et al., 2002)
^eroot mean square displacement of KT on chromatin spring (Chacon, et al., 2014)
^f(Cheeseman, et al., 2002)