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. Author manuscript; available in PMC: 2018 Feb 28.
Published in final edited form as: ACS Nano. 2017 Feb 8;11(2):1869–1883. doi: 10.1021/acsnano.6b07895

Figure 1.

Figure 1

TEM characterization of micron- and nano-sized GaAs and InAs particles. The particles were suspended at 50 µg/mL and applied to TEM grids. Images were taken using a JEOL 2010 microscope operated at 200 keV. Scale bars represent 0.2 µm for micron-sized particles, and 100 nm for nano-sized particles.