Subject area	Physics, Electrical Engineering
More specific subject area	Materials Science, Photodetector
Type of data	Figures, Images
How data was acquired	Field emission scanning electron microscope (FESEM, JOEL, JSM_7800 F)
	X-ray photoelectron spectroscopy (XPS, PHI 5000 VersaProbe ll)
	UV-visible diffused reflectance photo spectrometer (Simadzu, UV-2600)
	Potentiostat/Galvanostat (ZIVE SP1, WonA Tech, Korea)
Data format	Analyzed
Experimental factors	FESEM (Working distance 10 mm, 15 kV, specimen without conducting coating)
	XPS (samples prepared on the Si wafer, scan time 30 min, full scan)
	Light source (wavelength 850 nm, various frequency, square wave)
	Current-time (Chronoamperometry, Bias 0 V to -1.5 V, data interval 40 μs)
Experimental features	Vertically grown SnS layers
Data source location	Incheon National University, Incheon 22012, Korea
Data accessibility	The data are with this article