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. 2017 Aug 7;13:66. doi: 10.1186/s13007-017-0215-1

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© The Author(s) 2017

Open AccessThis article is distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution, and reproduction in any medium, provided you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The Creative Commons Public Domain Dedication waiver (http://creativecommons.org/publicdomain/zero/1.0/) applies to the data made available in this article, unless otherwise stated.

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Fig. 1 — Major technical procedures of the V1TMD method for evaluation of antixenosis against common cutworm in soybean seedlings. a The micro-netroom in greenhouse; b soybean seedlings at VE stage in seed nursery tray; c soybean seedlings at VC stage in seed nursery tray; d soybean seedlings at V1 stage, when canopy structure has formed and artificial infestation has started; e the average DLP of whole accessions is about 35% after artificial infestation; f the average DLP of whole accessions is about 50%; g the average DLP of whole accessions is about 70%; h the average DLP of whole accessions was about 80%; i the photo of highly resistant accession (59, Lamar) and highly susceptible accession (6, MYBMD)