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. 2017 Jul 25;13(7):e1005667. doi: 10.1371/journal.pcbi.1005667

Fig 6.

Fig 6

(A) The distribution of the numbers of significantly tuned features per unit, overlaid with a replot of [4, Fig. 3c]. (B) The distribution of the numbers of significantly tuned units for each feature parameter, overlaid with a replot (red boxes) of [4, Fig. 3d].