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. 2017 Aug 9;7:7654. doi: 10.1038/s41598-017-06837-1

Figure 8.

Figure 8

Comparison between annular illumination TIE and circular illumination TIE. (a) The raw Siemens star image and the corresponding best diffraction limited image can be achieved based on the simulation parameter. (b) Comparison of over-defocus images and reconstruction results of different illumination settings for a small defocus distance (Δz = 0.5 μm).