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. 2017 Jul 17;10(7):813. doi: 10.3390/ma10070813
a-Ge preamorphized (Section 2) or amorphous germanium (Section 5)
a-Si preamorphized (Section 3) or amorphous silicon (Section 5)
FIB focused ion beam
GPGPU general purpose computation on graphics processing unit
IBIESD ion-beam induced enhanced self-diffusion
MBE molecular beam epitaxy
MD molecular dynamics
PDT pixel dwell time
PKA primary knock-on atom
RBS/C Rutherford backscattering spectrometry in channeling geometry
RDF radial distribution function
SIMS secondary ion mass spectrometry
SPE solid phase epitaxy
SW Stillinger-Weber
XTEM cross-sectional transmission electron microscope