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. 2017 Aug 11;7:7962. doi: 10.1038/s41598-017-08642-2

Table 3.

Results of particle size analysis carried out on data from surface topographs shown in Fig. 4 (a) to (d).

Device A Device B Device C Device D
Defects per 1 cm2 100 140 320 420
Height (µm) 2 (5) 4 (24) 2 (12) 3 (14)

Average values are shown outside and maximum values inside parentheses. Data was thresholded at 1 µm and image area remained fixed at 13.5 mm2.