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. Author manuscript; available in PMC: 2018 Jun 1.
Published in final edited form as: Chem Geol. 2017 Apr 17;460:25–36. doi: 10.1016/j.chemgeo.2017.04.008

Fig. 7.

Fig. 7

Etch pit cross section profile defined by the red line segment in Fig. 6. The uncertainty in the individual measurements along the profile is characterized as the temporal standard deviation of the measurement on a single pixel, 2 nm. (For interpretation of the references to color in this figure legend, the reader is referred to the web version of this article.)