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. 2017 May 10;4(Pt 4):322–339. doi: 10.1107/S2052252517005760

Figure 7.

Figure 7

The experimental reduction in scattering-factor error measurement (R split) with increasing number N of diffraction patterns follows a Poisson error law R split = k/N 1/2. For this SFX analysis of the photosystem II complex (PDB entry 3wu2) k = 18.5. Progress in SFX algorithm development, partial reflection analysis and scaling is measured by the reduction in k in recent years.