Figure 4.

(a) $\mathit{\phi }({\overline{N}}_{phe})$ is calculated based on x‐ray energy, scintillator thickness, conversion gain, and an assumption of $\overline{\mathit{\epsilon }}(z)$, and is sorted into bins of width ΔN defined by the experimental apparatus. (b) The total variance in measurements of ${\overline{N}}_{phe}$ is calculated according to Eq. (4) and used to calculate normal distributions centered at each bin of $\mathit{\phi }({\overline{N}}_{phe})$. (c) The calculated distributions are then summed to model measured PHS.