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. 2017 Aug 30;8:394. doi: 10.1038/s41467-017-00427-5

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© The Author(s) 2017

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

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Fig. 2 — ADF-STEM images, EELS, and EDX characterizations of the as-synthesized NbSe₂ atomic layers. a A low magnified annular dark-field scanning transmission electron microscope (ADF-STEM) image showing a large region of monolayer NbSe₂ encapsulated by the graphene sandwich. The schematic is shown in the inset. b Atomic resolution ADF-STEM image of the hexagonal NbSe₂ lattice. Diselenium vacancies are highlighted by red circles. The inset of panel b shows the structural model of 2H-NbSe₂, with cyan and green color indicating Nb and Se atoms, respectively. c Different point defects in monolayer NbSe₂ and their atomic models. Diselenium vacancy, monoselenium vacancy, and anti-site defect Se_Nb are highlighted by red, blue, and yellow circles, respectively. d Atomic resolution ADF-STEM image of two bilayer islands in NbSe₂, showing the coexistence of 2H _a and 2H _c stacking sequence. The insets are corresponding atomic models and simulated STEM images. e STEM image of a large region of NbSe₂ used for the collection of electron energy-loss spectroscopy (EELS) and energy-dispersive X-ray spectrometry (EDX) spectra. The collected region is highlighted in red square. Nb and Se EELS mapping are provided next to it. f Typical EELS and g EDX spectra of the region shown in e. The Cu signal in the EDX spectra comes from the Cu grid. Scale bars, 500 nm (a), 2 nm (b), 0.5 nm (c), 5 nm (d), 50 nm (e)