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. Author manuscript; available in PMC: 2017 Sep 6.
Published in final edited form as: Nano Futures. 2017 May 2;1(1):015005. doi: 10.1088/2399-1984/aa6a48

Figure 2.

Figure 2

(a) Secondary electron image of a standard tin ball resolution target acquired using a focused 10 keV, 1 pACs+ ion beam from the LoTIS. (b) Secondary electron image of a pattern milled in the edge of a Cu grid using a similar Cs+ ion beam. Milling time for this pattern was approximately 120 s.