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. Author manuscript; available in PMC: 2018 Feb 1.
Published in final edited form as: Nat Methods. 2017 Jun 19;14(8):805–810. doi: 10.1038/nmeth.4335

Figure 1. Low background experimental setup for fast fixed-target SFX experiments using the Roadrunner goniometer.

Figure 1

(a) Front view: The silicon chip is raster scanned through the X-ray beam (green) while maintained in a continuous stream of humidified air (blue). A helium sheath flow (yellow) is used to confine the humidity stream and to reduce air scattering. Air scattering is further reduced by helium injection along the beam path. An inline microscope is used for proper chip alignment and definition of the scanning grid. (b) Back view: X-ray diffraction caused by the sample crystals is recorded with a Cornell-SLAC hybrid pixel array detector (CSPAD). After hitting the sample, the primary beam is enclosed by a molybdenum tubule and additional steel tubules, which further absorb air-scattered photons. In b, the inline microscope is not shown for clarity.