Fig. 5.

Observed $O_{\text{NN}}$ distributions (a, b) in the $W$ + jets VR and (c, d) in the $t\overline{t}$ VR compared to the model obtained from simulated events. The simulated distributions are normalised to the event rates obtained by the fits of the $E_{\text{T}}^{\text{miss}}$ distributions as described in Sect. 6. The hatched uncertainty band represents the uncertainty in the pre-fit process cross-sections and the bin-by-bin MC statistical uncertainty, added in quadrature. The lower panels show the ratio of the observed to the expected number of events in each bin