Fig. 8.

Observed distributions of $cos{\mathit{\theta }}^{\ast }(\ell ,j)$ in a the ${\ell }^{+}$ SR and in b the ${\ell }^{-}$ SR compared to the model obtained from simulated events. The simulated distributions are normalised to the event rates obtained by the fit to the $O_{\text{NN}}$ distributions. The hatched uncertainty band represents the total uncertainty in the rates of all processes after the fit and the bin-by-bin MC statistical uncertainty, added in quadrature. The lower panels show the ratio of the observed to the expected number of events in each bin to illustrate the goodness-of-fit.