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. 2017 Aug 9;77(8):531. doi: 10.1140/epjc/s10052-017-5061-9

Table 3.

Event yields for the different processes estimated with the fit to the ONN distribution compared to the numbers of observed events. Only the statistical uncertainties are quoted. The Z,VV+jets contributions and the multijet background are fixed in the fit; therefore no uncertainty is quoted for these processes

Process ν^(+) ν^(-)
tq 11,800 ± 200 17 ± 1
t¯q 11 ± 1 6920 ± 170
tt¯,Wt,tb¯/t¯b 19,300 ± 740 18,900 ± 730
W++ jets 18,800 ± 780 48 ± 2
W-+ jets 23 ± 1 13,100 ± 740
Z,VV+jets 1290 1190
Multijet 4520 4520
Total estimated 55,800 ± 1100 44,700 ± 1100
Data 55,800 44,687