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. 2017 Aug 25;18(1):584–610. doi: 10.1080/14686996.2017.1361305

Figure 16.

Figure 16.

(a) Backscattered SEM image showing microstructural transition from x = 0.8 to x = 1.0 along compositionally graded LENS-deposited AlxCrCuFeNi2. EBSD phase maps showing fcc (red) and bcc (green) distribution in (b) x = 0.8 and (c) x = 1.0 [76].