Table 1.
TECHNIQUE | FORCE SENSITIVITY |
---|---|
Optical Tweezers | 1–100 pN |
Atomic Force Microscope | 10–105 pN |
Magnetic Tweezers | 10–103 pN |
Gel Wrinkling Method | 10–100 nN |
Micropost Deformation | 1–100 nN |
Cell Traction Force Microscope | 10–106 pN |
TECHNIQUE | FORCE SENSITIVITY |
---|---|
Optical Tweezers | 1–100 pN |
Atomic Force Microscope | 10–105 pN |
Magnetic Tweezers | 10–103 pN |
Gel Wrinkling Method | 10–100 nN |
Micropost Deformation | 1–100 nN |
Cell Traction Force Microscope | 10–106 pN |