Skip to main content
. Author manuscript; available in PMC: 2018 Jul 24.
Published in final edited form as: Smart Mater Struct. 2017 Jul 24;26(8):085038. doi: 10.1088/1361-665X/aa770b

Table 2.

Oxide thickness profile derived from XPS data. The oxide thickness has an uncertainty of 1 nm due to the finite step size of the Ar etching.

Anneal time (min) Environment Oxide thickness (nm)
0 (as-cast) N/A 3.9
30 Atm. 6.7
60 Atm. 7.6
30 Vac. 4.6
60 Vac. 5.5
60 N2 3.3