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. 2017 Sep 5;114(38):10041–10046. doi: 10.1073/pnas.1708882114

Fig. 1.

Fig. 1.

(A) X-ray structure factors S(Q) of SiO2 glass at selected pressures (in gigapascals) during compression. (B) Radial distribution functions g(r) of SiO2 glass obtained by Fourier transform of the structure factors. The pressures are given next to the curves.