Table 3.
Properties | Si | 3C-SiC | 4H-SiC | 6H-SiC | GaAs | GaN | AlN |
---|---|---|---|---|---|---|---|
Band gap (eV) | 1.12 | 2.36 | 3.23 | 3.05 | 1.4 | 3.4 | 6.2 |
Thermal Expansion coefficient | 2.6 | 2.9 | - | 4.2 | 5.7 | 5.6 | 4.5 |
Lattice constant (nm) | 0.543 | 0.435 | 0.307 | 0.308 | |||
Thermal conductivity | 1.5 | 3.3-4.9 | 3.7 | 4.9 | 0.46 | 1.3 | 3 |
Density | 2.33 | 3.21 | 3.21 | 3.21 | 5.32 | 6.15 | 3.25 |
Electronic maximum operating temperature (°C) | 150 | 600 | 750 | 700 | 350 | >700 | >700 |
Relative dielectric constant | 11.8 | 9.72 | 9.7 | 9.66 | 12.5 | 11 | 10 |
Young Modulus (GPa) | 130–185 | 310–550 | 390–690 | 390–690 | 85.5 | 271 | 302–348 |
Physical stability | Good | Excellent | - | - | Fair | Good | Good |
Hole mobility | 480 | 40 | 115 | 90 | 400 | 250 | 14 |
Electron mobility | 1430 | 800 | 8500 | 1250 | - | ||
Breakdown field | 3 | >15 |
|
6 | >50 | >50 | |
Saturation electron velocity | 1 | 2.5 | 2 | 2 | 1 | 2.2 | 1.4 |