Figure - PMC

Skip to main content

An official website of the United States government

Here's how you know

Here's how you know

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

View full-text article in PMC

. 2017 Oct 3;8:773. doi: 10.1038/s41467-017-00907-8

Search in PMC
Search in PubMed
View in NLM Catalog
Add to search

© The Author(s) 2017

Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.

PMC Copyright notice

Fig. 3 — Refractive index modification achieved in the bulk of silicon with ultrashort pulses. Micro-modifications are created at the centre of silicon spheres using focused 60-fs laser pulses with the hyper-NA value of 2.97 (illustrated by the sketch) and then analyzed by infrared microscopy. a Bright-field infrared images of modifications for different number of applied laser pulses. b Transmission image in logarithmic scale revealing a modification after the first applied laser shot. c Differential-longitudinal interferometry measurement (for two pixels A and B shown on the image for 1000 pulses) and corresponding phase image for the modification created with 1000 applied pulses. This indicates a local change of the silicon refractive index Δn < −0.07 after repeated illumination. (scale bars: 2 µm)