Fig. 5. (a) 26 × 26 μm spatially resolved current map (equipotential image) obtained at –0.85 V vs. RHE (see Movie S4† for full potential range). Surface current line profile (surface current at –0.85 V vs. RHE versus x-position) taken from the dashed red line indicated in (a). The following parameters were used in (a) and (b): [HClO4] = 100 mM, ν = 0.25 V s–1, E b = +0.05 V, r a = 220 nm and r b = 110 nm. (c) 18 × 18 μm AFM topographical scan taken of the scan area in (a). (d) AFM line profile of the area indicated by the dashed red line in (c). Each of the surface defects (steps) are labelled (1) to (6).
