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. Author manuscript; available in PMC: 2017 Oct 6.
Published in final edited form as: Proc SPIE Int Soc Opt Eng. 2017 Mar;10132:1013210. doi: 10.1117/12.2255695

Figure 6.

Figure 6

(A) Details of a radiographic line pattern phantom imaged using two CMOS panels with different CsI thicknesses (nominal frequencies, from left to right: 4, 4.3, 4.6, 5 lp/mm). Average profiles though the line patterns are shown in (B). In (C), reconstructions of the Tungsten wire phantom are compared for the two CMOS panels. The thinner scintillator achieves 12% improvement in FWHM.